Contour Measuring Instrument

Model Lineup

EF550A series

Supporting for hard analysis by Macroanalysis.

  • Compact with portable
  • By real time output function, the megnifing contour date of measuring can be taken
  • Communicating with FGA51 is available
Accuracy Z:±(2.5 + 0.5×|H|)μm or less
 H:Displacement(mm)
X:±(2.5 + 0.02L)μm or less
 L:Measuring Length(mm)
Resolution Z: 0.25 μm , 0.1 μm for X Axis Scale
Sampling Points / Pitch Max. 64,000 Points / Min. 0.5 μm
Measuring Range Z : 30 mm , X : 50 mm
Measuring Magnification Z , X : 1 - 2,000

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EF800 series

A high-performance contour shape measuring machine that can move at ultra-high speed and has a full range of analysis functions.

  • Equipped with pick-up overload halt function as standard
  • Frequent use can be set by shortcut function
  • Easy re-measuring is possible without remaking new program
Z Max measuring range EF800-G : 50 mm , EF800-N : 60 mm
X Max measuring range 100 mm
Straightness 1.0 μm / 100 mm
Stylus Chisel type R25 μm 8°
Installation size
W 1500 x D 800 mm

Catalog download

Inquiry Form

Inquiries by phone

(+81) 3-5812-2011

FAX (+81) 3-5812-2015

【Hours available】Monday to Friday. 8:30am to 17:10pm.